Events & Seminars
Minesoft offers regular demonstrations and training seminars for its
services - from online webinars and tutorials to presentations at industry events.
If you would like to organise a tailored demonstration or some training for your company, please contact us
Professional training at your desk.
Request personalised, free online PatBase training - tailored sessions one-to-one or for your entire department.
Click here to arrange a training session
Minesoft regularly exhibits at industry events to stay in touch with our clients and to demonstrate our products and services to IP professionals. You can find us at the following events this year:
|Global IP Convention||15th - 17th January 2015||Mumbai, India|
We will be holding a workshop at this exhibition. For more details and to book your place, please click here.
|16th - 20th February 2015||San Francisco, USA|
|AUTM 2015 Annual Meeting||22nd - 25th February 2015||New Orleans, USA|
|SCALL Institute 2015||27th - 28th February 2015||California, USA|
|IPI Confex 2015||8th - 11th March 2015||Rome, Italy|
|Nordic IPR||24th - 26th March 2015||Stockholm, Sweden|
|Information Tools for IP and Intelligence||26th - 27th March 2015||Clarke Quay, Singapore|
|LES International||10th - 15th April 2015||Brussels, Belgium|
|PHT SLA Spring Meeting 2015||19th - 21st April 2015||Las Vegas, USA|
|II SDV 2015||20th - 21st April 2015||Nice, France|
|PIUG Annual 2015||2nd - 7th May 2015||Lombard, USA|
|LAIPLA Spring Seminar 2015||29th - 31st May 2015||California, USA|
|IPBC Global||14th - 16th June 2015||San Francisco, California|
|IP Service World||23rd - 24th November 2015||Germany|
Minesoft regularly holds PatBase courses across Europe throughout the year,
offering structured, hands-on training. A schedule and details for upcoming courses can be found below.
Contact us to register your interest in a course; a full schedule will be made available soon.
For training in USA and other parts of the world, please contact us at firstname.lastname@example.org for more information.